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Product Name:
Wafer Inspection Microscope
Model Number:
XLE-3 10
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Description:
The XLE-3 series reflected light inspection microscope is the newest medium inspection microscope in China. The adoption of reflected coaxial illumination ensures the bright-field observation. It can be connected with 135 camera, digital camera and image quantitative analysis. This instrument is suitable for the inspection requirements of a variety of electronic components including magnetic heads, LCD, and semiconductors. Its compact size, ease of operation, 10" x 10" stage travel and cost-effectiveness makes the XLE-3 an ideal inspection microscope offering superb operational versatility. The instrument is equipped with plan objective and wide-field eyepiece and obtains clear and smooth image. The unique character is the super large stage which can make quick-handed and knob-fine movement. The samples on the stage can be moved vertically and horizontally.
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Alltion Microscope Co.,Ltd. ( Medical Surgical Microscopes )
Suite B, 11/F, Lijing Tower, Cathay Plaza, NO.18, Zhongshan Road
Wuzhou City
Guangxi Province
China
Zip Code: 543000
Tel: 86-774-2836101
Fax: 86-774-2836192
Website:
http://wzalltion.en.supplierlist.com
http://www.microscopeco.com
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